- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2204 - Specimen supports therefor; Sample conveying means therefor
Patent holdings for IPC class G01N 23/2204
Total number of patents in this class: 121
10-year publication summary
|
1
|
3
|
15
|
11
|
17
|
9
|
24
|
10
|
22
|
11
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Shimadzu Corporation | 5791 |
8 |
| FEI Company | 851 |
8 |
| Sigray, Inc. | 68 |
7 |
| Rigaku Corporation | 379 |
6 |
| Battelle Memorial Institute | 2356 |
5 |
| National Institute for Materials Science | 1108 |
5 |
| Institute of Microbiology, Chinese Academy of Sciences | 97 |
4 |
| Hitachi High-Tech Corporation | 4424 |
4 |
| Nikon Metrology, NV | 69 |
3 |
| HORIBA, Ltd. | 746 |
3 |
| JEOL Ltd. | 556 |
3 |
| Hitachi, Ltd. | 16452 |
2 |
| Commonwealth Scientific and Industrial Research Organisation | 1652 |
2 |
| Enersoft Inc. | 28 |
2 |
| Materials Analysis Technology Inc | 30 |
2 |
| Nanjing University of Aeronautics and Astronautics | 360 |
2 |
| NuFlare Technology, Inc. | 770 |
2 |
| SPECS Surface Nano Analysis GmbH | 55 |
2 |
| Chrysos Corporation Limited | 15 |
2 |
| Icagen, LLC | 38 |
2 |
| Other owners | 47 |